A technical paper titled “Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning” was published by researchers at University of Texas at Dallas, Intel Corporation, NXP Semiconductors, and Texas Instruments.

Abstract:

“Given the widespread use of safety-critical applications in the automotive field, it is crucial to ensure the Functional Safety (FuSa) of circuits and components within automotive systems. The Analog and Mixed-Signal (AMS) circuits prevalent in these systems are more vulnerable to faults induced by parametric perturbations, noise, environmental stress, and other factors, in comparison to their digital counterparts. However, their continuous signal characteristics present an opportunity for early anomaly detection, enabling the implementation of safety mechanisms to prevent system failure. To address this need, we propose a novel framework based on unsupervised machine learning for early anomaly detection in AMS circuits. The proposed approach involves injecting anomalies at various circuit locations and individual components to create a diverse and comprehensive anomaly dataset, followed by the extraction of features from the observed circuit signals. Subsequently, we employ clustering algorithms to facilitate anomaly detection. Finally, we propose a time series framework to enhance and expedite anomaly detection performance. Our approach encompasses a systematic analysis of anomaly abstraction at multiple levels pertaining to the automotive domain, from hardware- to block-level, where anomalies are injected to create diverse fault scenarios. By monitoring the system behavior under these anomalous conditions, we capture the propagation of anomalies and their effects at different abstraction levels, thereby potentially paving the way for the implementation of reliable safety mechanisms to ensure the FuSa of automotive SoCs. Our experimental findings indicate that our approach achieves 100% anomaly detection accuracy and significantly optimizes the associated latency by 5X, underscoring the effectiveness of our devised solution.”

Find the technical paper here. Published April 2024 (preprint).

Arunachalam, Ayush, Ian Kintz, Suvadeep Banerjee, Arnab Raha, Xiankun Jin, Fei Su, Viswanathan Pillai Prasanth, Rubin A. Parekhji, Suriyaprakash Natarajan, and Kanad Basu. “Enhancing Functional Safety in Automotive AMS Circuits through Unsupervised Machine Learning.” arXiv preprint arXiv:2404.01632 (2024).

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