With highly competitive time-to-market and time-to-volume windows, IC suppliers need to be able to release new product to production (NPI) in a timely manner with competitive manufacturing metrics. Manufacturing yield, test time and quality are important metrics in NPI to Manufacturing safe launch. A powerful yield management system is crucial to achieve the goal metrics. In this paper, recommended yield management system selection criteria, data integration methodology and innovative ways of using selected yield management system to benefit safe launch efficiency are introduced. Three examples of using cloud yield tool to expedite yield learning, test time reduction (TTR) and quality enhancement are presented.

Find more information here.

The post Expediting Manufacturing Safe Launch With Big Data AI/ML Analytic Solutions On The Cloud appeared first on Semiconductor Engineering.